Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

K. Fukumoto; Y. Yamada; T. Matsuki; Ken Onda; T. Noguchi; R. Mizokuchi; S. Oda; S. Koshihara

Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

K. Fukumoto, Y. Yamada, T. Matsuki, Ken Onda, T. Noguchi, R. Mizokuchi, S. Oda, S. Koshihara

研究成果: 書籍/レポートタイプへの寄稿 › 会議への寄与

抄録

We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

本文言語	英語
ホスト出版物のタイトル	19th International Conference on Ultrafast Phenomena, UP 2014
出版社	Optical Society of American (OSA)
ISBN（印刷版）	1557522790, 9781557522795
出版ステータス	出版済み - 2014
外部発表	はい
イベント	19th International Conference on Ultrafast Phenomena, UP 2014 - Okinawa, 日本継続期間: 7月 7 2014 → 7月 11 2014

その他

その他	19th International Conference on Ultrafast Phenomena, UP 2014
国/地域	日本
City	Okinawa
Period	7/7/14 → 7/11/14

!!!All Science Journal Classification (ASJC) codes

器械工学
原子分子物理学および光学

他のファイルとリンク

引用スタイル

Fukumoto, K, Yamada, Y, Matsuki, T, Onda, K, Noguchi, T, Mizokuchi, R, Oda, S & Koshihara, S 2014, Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy. in 19th International Conference on Ultrafast Phenomena, UP 2014. Optical Society of American (OSA), 19th International Conference on Ultrafast Phenomena, UP 2014, Okinawa, 日本, 7/7/14.

@inproceedings{478d91c048ca47e98f55772ace06fa59,

title = "Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy",

abstract = "We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.",

author = "K. Fukumoto and Y. Yamada and T. Matsuki and Ken Onda and T. Noguchi and R. Mizokuchi and S. Oda and S. Koshihara",

year = "2014",

language = "English",

isbn = "1557522790",

booktitle = "19th International Conference on Ultrafast Phenomena, UP 2014",

publisher = "Optical Society of American (OSA)",

note = "19th International Conference on Ultrafast Phenomena, UP 2014 ; Conference date: 07-07-2014 Through 11-07-2014",

}

TY - GEN

T1 - Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

AU - Fukumoto, K.

AU - Yamada, Y.

AU - Matsuki, T.

AU - Onda, Ken

AU - Noguchi, T.

AU - Mizokuchi, R.

AU - Oda, S.

AU - Koshihara, S.

PY - 2014

Y1 - 2014

N2 - We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

AB - We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

UR - http://www.scopus.com/inward/record.url?scp=84906690202&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84906690202&partnerID=8YFLogxK

M3 - Conference contribution

SN - 1557522790

SN - 9781557522795

BT - 19th International Conference on Ultrafast Phenomena, UP 2014

PB - Optical Society of American (OSA)

T2 - 19th International Conference on Ultrafast Phenomena, UP 2014

Y2 - 7 July 2014 through 11 July 2014

ER -

Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

抄録

その他

!!!All Science Journal Classification (ASJC) codes

他のファイルとリンク

フィンガープリント

引用スタイル