Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning

Jacqueline Yan, Masahiro Oroku, Youhei Yamaguchi, Takashi Yamanaka, Yoshio Kamiya, Taikan Suehara, Sachio Komamiya, Toshiyuki Okugi, Nobuhiro Terunuma, Toshiaki Tauchi, Sakae Araki, Junji Urakawa

研究成果: ジャーナルへの寄稿会議記事査読

3 被引用数 (Scopus)

抄録

A novel final focus system design featuring the Local Chromaticity Correction scheme has beenproposed for ILC. This is to be verified at ATF2, a test facility for ILC, through focusing an e-beam down to the design vertical beam size ("σy") of 37 nm. Shintake Beam Size Monitor ("IPBSM"),installed at the virtual interaction point of ATF2, is the only existing device capable of measuring σy below 100 nm, making it indispensable for achieving the goals of ATF2 and a strong candidate for R&D at future linear colliders. This is attributed to its ingenious technique of scanning the phase oflaser interference fringes relative to the e-beam. Beam sizes are derived from the resulting Compton signal modulation measured by a downstream detector. Having been upgraded in a variety of ways since its first debut at FFTB, Shintake Monitor is capable of measuring a wide range of σy from 25 nm to 6 μm with better than 10% resolution. This paper describes the system's design, role in beam tuning, and various hardware upgrades to further improve its performance.

本文言語英語
ページ(範囲)1989-1996
ページ数8
ジャーナルPhysics Procedia
37
DOI
出版ステータス出版済み - 2012
外部発表はい
イベント2nd International Conference on Technology and Instrumentation in Particle Physics, TIPP 2011 - Chicago, 米国
継続期間: 6月 9 20116月 14 2011

!!!All Science Journal Classification (ASJC) codes

  • 物理学および天文学一般

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