Severe hazards in two dimensional position sensing using wedge & strip and Backgammon based patterns

F. Javanmardi, T. Sakae, A. Nohtomi, Y. Uozumi, M. Matoba

研究成果: 会議への寄与タイプ学会誌査読

抄録

The most unfavorable phenomenon in 2D position sensing is the readout dependence of the two independent dimensions (X, Y). The patterned cathodes, such as the wedge-and-strip, Backgammon, Chevron and Triple Charge Division patterns, are very sensitive to the source displacement perpendicular to their position sensitive directions (X). This sensitivity results in severe dependance for the horizontal readout to the vertical readout. The predicted deviation due to vertical displacements of a given source, which is experimentally confirmed shows that the deviation varies with the source displacement along the X axes. This deviation has a maximum value (about 10% of the full length) at the center of the pattern. Since the deviation varies along the X direction, finding a transfer function for correcting the readout is impossible. Using the patterned cathodes in multi wire proportional counters are possible if the wire spacing is a multiple of the pattern width. Also, these cathodes can be used for two dimensional position sensing, without any limitation, if the readout position in the other dimension is done using drift times of the primary electrons. Using this combination, a high resolution (.25 mm) safe 2D ray trace type patterned telescope was manufactured for particle detection with low threshold energy.

本文言語英語
ページ574-578
ページ数5
出版ステータス出版済み - 1997
外部発表はい
イベントProceedings of the 1997 IEEE Nuclear Science Symposium - Albuquerque, NM, USA
継続期間: 11月 9 199711月 15 1997

その他

その他Proceedings of the 1997 IEEE Nuclear Science Symposium
CityAlbuquerque, NM, USA
Period11/9/9711/15/97

!!!All Science Journal Classification (ASJC) codes

  • 核物理学および高エネルギー物理学
  • 放射線
  • 放射線学、核医学およびイメージング

フィンガープリント

「Severe hazards in two dimensional position sensing using wedge & strip and Backgammon based patterns」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル