Resonant inelastic X-ray scattering of EuNi2(Si1-xGe x)2 and Eu2O3 at Eu L3 absorption edge

H. Yamaoka, M. Taguchi, A. M. Vlaicu, H. Oohashi, K. Yokoi, D. Horiguchi, T. Tochio, Y. Ito, K. Kawatsura, K. Yamamoto, A. Chainani, S. Shin, M. Shiga, H. Wada

研究成果: ジャーナルへの寄稿学術誌査読

22 被引用数 (Scopus)

抄録

Bulk sensitive spectroscopies were performed for mixed valent compounds EuNi2(Si1-xGex)2 as a function of x, and Eu-sesquioxide (Eu2O3), using techniques of high-resolution partial-fluorescence yield (PFY) and resonant inelastic x-ray scattering (RIXS) at the Eu L3 absorption edge. The evolution of mean-valency as a function of chemical composition x in EuNi2(Si 1-xGex)2 shows a drastic change between x = 0.5 and 0.7. The experimental results also show a small amount of mixed valency for the end members, i.e., x = 1 and 0 samples are also mixed valent. Single-impurity Anderson model calculations show good agreement with the PFY and RIXS experimental results, and thus provide a consistent set of electronic structure parameters. The composition controlled drastic change in meanvalence between x = 0.5 and 0.7 is derived from a large hybridization change, consistent with the Kondo volume collapse picture.

本文言語英語
論文番号034702
ジャーナルjournal of the physical society of japan
75
3
DOI
出版ステータス出版済み - 3月 2006

!!!All Science Journal Classification (ASJC) codes

  • 物理学および天文学(全般)

フィンガープリント

「Resonant inelastic X-ray scattering of EuNi2(Si1-xGe x)2 and Eu2O3 at Eu L3 absorption edge」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル