TY - JOUR
T1 - Reliability investigation of repeated unclamped inductive switching in a diode-clamped SiC circuit breaker
AU - Takamori, Taro
AU - Wada, Keiji
AU - Saito, Wataru
AU - Nishizawa, Shin ichi
N1 - Publisher Copyright:
© 2023 Elsevier Ltd
PY - 2023/11
Y1 - 2023/11
N2 - This paper investigates the reliability of a solid-state circuit breaker with a clamped SiC diode as avalanche voltage after repeated cutoff operations. In solid-state circuit breakers, a clamping element is connected in parallel with a power semiconductor switch to divert the cutoff current. The SiC merged PiN Schottky (MPS) diode is one of the candidates for clamping elements in solid-state circuit breakers because of its high avalanche tolerance and good robustness after the shocks. Reliability tests indicate that no significant electrical characteristics are found for both the SiC MOSFET and the SiC MPS diode in the proposed circuit breaker, even after more than 10,000 unclamped inductive switching (UIS) cycles. These results are based on a 400 V, 50 A DC distribution system with the UIS condition. The results show that the SiC MPS diode works well as a clamped element for the long-term reliability of the solid-state circuit breaker.
AB - This paper investigates the reliability of a solid-state circuit breaker with a clamped SiC diode as avalanche voltage after repeated cutoff operations. In solid-state circuit breakers, a clamping element is connected in parallel with a power semiconductor switch to divert the cutoff current. The SiC merged PiN Schottky (MPS) diode is one of the candidates for clamping elements in solid-state circuit breakers because of its high avalanche tolerance and good robustness after the shocks. Reliability tests indicate that no significant electrical characteristics are found for both the SiC MOSFET and the SiC MPS diode in the proposed circuit breaker, even after more than 10,000 unclamped inductive switching (UIS) cycles. These results are based on a 400 V, 50 A DC distribution system with the UIS condition. The results show that the SiC MPS diode works well as a clamped element for the long-term reliability of the solid-state circuit breaker.
KW - Avalanche breakdown
KW - Characteristics fluctuation
KW - Silicon carbide
KW - Solid-state circuit breaker
KW - Unclamped inductive switching
UR - http://www.scopus.com/inward/record.url?scp=85174743451&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85174743451&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2023.115119
DO - 10.1016/j.microrel.2023.115119
M3 - Article
AN - SCOPUS:85174743451
SN - 0026-2714
VL - 150
JO - Microelectronics Reliability
JF - Microelectronics Reliability
M1 - 115119
ER -