TY - GEN
T1 - Quantitative analysis between visual mismatch negativity and psychopathology scale for schizophrenia
AU - Goto, Kazuhiko
AU - Sugi, Takenao
AU - Maekawa, Toshihiko
AU - Ogata, Katuya
AU - Goto, Yoshinobu
AU - Tobitnatsu, Shozo
AU - Nakatnura, Masatoshi
N1 - Copyright:
Copyright 2010 Elsevier B.V., All rights reserved.
PY - 2009
Y1 - 2009
N2 - Visual mismatch negativity (v-MMN) in electroencephalographic (EEG) record provides an index of preattentive information processing of the brain. v-MMN is considered to reflect schizophrenia. The positive and negative syndrome scale (PANSS) is usually used in clinical diagnosis on patients with schizophrenia for estimating the degree of disorder. Tn this study, the relationship between v-MMN and PANSS was analyzed. Characteristic parameters of peaks including Nl, N2, P300, and MMN were established respectively. Estimated function was constructed by selected parameters. P300 was most significant characteristic related to all items of PANSS.
AB - Visual mismatch negativity (v-MMN) in electroencephalographic (EEG) record provides an index of preattentive information processing of the brain. v-MMN is considered to reflect schizophrenia. The positive and negative syndrome scale (PANSS) is usually used in clinical diagnosis on patients with schizophrenia for estimating the degree of disorder. Tn this study, the relationship between v-MMN and PANSS was analyzed. Characteristic parameters of peaks including Nl, N2, P300, and MMN were established respectively. Estimated function was constructed by selected parameters. P300 was most significant characteristic related to all items of PANSS.
UR - http://www.scopus.com/inward/record.url?scp=77951114620&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77951114620&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:77951114620
SN - 9784907764333
T3 - ICCAS-SICE 2009 - ICROS-SICE International Joint Conference 2009, Proceedings
SP - 853
EP - 856
BT - ICCAS-SICE 2009 - ICROS-SICE International Joint Conference 2009, Proceedings
T2 - ICROS-SICE International Joint Conference 2009, ICCAS-SICE 2009
Y2 - 18 August 2009 through 21 August 2009
ER -