抄録
A method for density profile reconstruction by using a heavy ion beam probe was presented. The feasibility of the proposed method was demonstrated by performing a model calculation. The method provides a faster profile measurement of a temporal resolution of a few millisecond, in addition to quite good spatial resolution with millimeter.
本文言語 | 英語 |
---|---|
ページ(範囲) | 3335-3340 |
ページ数 | 6 |
ジャーナル | Review of Scientific Instruments |
巻 | 74 |
号 | 7 |
DOI | |
出版ステータス | 出版済み - 7月 2003 |
外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 器械工学