Potential measurements with heavy ion beam probe system on LHD

A. Shimizu, T. Ido, S. Nakamura, K. Toi, M. Nishiura, S. Kato

研究成果: ジャーナルへの寄稿学術誌査読

5 被引用数 (Scopus)

抄録

The heavy ion beam probe system in the Large Helical Device (LHD) was improved as follows. At first, the additional new sweeper was installed into the diagnostic port to extend the observable region. By using this sweeper, the potential profile was measured in a wider minor radius range than in previous experiments, in the case of outward shifted magnetic configuration of LHD. Next, the real time control system was installed to control the probe beam orbit for measuring the potential in plasma with large plasma current. In this system, a digital signal processor was used to control the probe beam in real time. The system worked well in the fixed position observation mode. In the sweeping mode for profile measurement, this control system became unstable. The details of this system and the experimental results are reported in this article.

本文言語英語
論文番号10E138
ジャーナルReview of Scientific Instruments
81
10
DOI
出版ステータス出版済み - 10月 2010
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 器械工学

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