Position sensitivity of a segmented planar Ge detector

E. Ideguchi, B. Cederwall, T. Bäck, L. Milechina, Y. Gono, Y. F. Yang, N. Aoi, T. Teranishi, D. Bucurescu, T. Kishida

研究成果: ジャーナルへの寄稿学術誌査読

6 被引用数 (Scopus)

抄録

A method to extract depth of interaction information for γ-rays in a segmented planar Ge detector is presented. The method is demonstrated on signals from a segmented detector which were stored by a digital oscilloscope event by event and analysed off-line. Event samples were acquired for different interaction points in the detector. A Compton scatter coincidence detection technique ensured that the event samples were highly enriched in single-interaction events. By analysing pulse shapes and the relative timing between anode pulses and the pulses from the irradiated cathode segment, a position sensitivity of 1-2 mm in the depth direction was deduced. A similar transverse position sensitivity was inferred by studying image charge pulses on neighbouring segments.

本文言語英語
ページ(範囲)373-384
ページ数12
ジャーナルNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
496
2-3
DOI
出版ステータス出版済み - 1月 11 2003
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 核物理学および高エネルギー物理学
  • 器械工学

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