Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

S. Lee; S. Duorah; A. Ejiri; H. Iguchi; A. Fujisawa; E. Ishiyama; Y. Takase; H. Toyama; M. Aramaki; M. Kojima; S. Okamura; K. Matsuoka

doi:10.1063/1.1150517

Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

S. Lee, S. Duorah, A. Ejiri, H. Iguchi, A. Fujisawa, E. Ishiyama, Y. Takase, H. Toyama, M. Aramaki, M. Kojima, S. Okamura, K. Matsuoka

研究成果: ジャーナルへの寄稿 › 学術誌 › 査読

抄録

A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature T_e with fast time resolution using the MLM spectrometer.

本文言語	英語
ページ（範囲）	1671-1674
ページ数	4
ジャーナル	Review of Scientific Instruments
巻	71
号	4
DOI	https://doi.org/10.1063/1.1150517
出版ステータス	出版済み - 4月 2000
外部発表	はい

!!!All Science Journal Classification (ASJC) codes

器械工学

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10.1063/1.1150517

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title = "Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system",

abstract = "A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature Te with fast time resolution using the MLM spectrometer.",

author = "S. Lee and S. Duorah and A. Ejiri and H. Iguchi and A. Fujisawa and E. Ishiyama and Y. Takase and H. Toyama and M. Aramaki and M. Kojima and S. Okamura and K. Matsuoka",

year = "2000",

month = apr,

doi = "10.1063/1.1150517",

language = "English",

volume = "71",

pages = "1671--1674",

journal = "Review of Scientific Instruments",

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TY - JOUR

T1 - Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

AU - Lee, S.

AU - Duorah, S.

AU - Ejiri, A.

AU - Iguchi, H.

AU - Fujisawa, A.

AU - Ishiyama, E.

AU - Takase, Y.

AU - Toyama, H.

AU - Aramaki, M.

AU - Kojima, M.

AU - Okamura, S.

AU - Matsuoka, K.

PY - 2000/4

Y1 - 2000/4

N2 - A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature Te with fast time resolution using the MLM spectrometer.

AB - A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature Te with fast time resolution using the MLM spectrometer.

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U2 - 10.1063/1.1150517

DO - 10.1063/1.1150517

M3 - Article

AN - SCOPUS:0347741753

SN - 0034-6748

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SP - 1671

EP - 1674

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 4

ER -

Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

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!!!All Science Journal Classification (ASJC) codes

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