Molecular aggregation structure of poly(fluoroalkyl acrylate) thin films evaluated by synchrotron-sourced grazing-incidence X-ray diffraction

Koji Honda; Hirohiko Yakabe; Tomoyuki Koga; Sono Sasaki; Osami Sakata; Hideyuki Otsuka; Atsushi Takahara

doi:10.1246/cl.2005.1024

Molecular aggregation structure of poly(fluoroalkyl acrylate) thin films evaluated by synchrotron-sourced grazing-incidence X-ray diffraction

Koji Honda
, Hirohiko Yakabe
, Tomoyuki Koga
, Sono Sasaki
, Osami Sakata
, Hideyuki Otsuka
, Atsushi Takahara

分子集積化学部門

研究成果: ジャーナルへの寄稿 › 学術誌 › 査読

38 被引用数 (Scopus)

抄録

Molecular aggregation structure of poly(fluoroalkyl acrylate) [PFA-C _y, where y is the fluoromethylene number of the fluoroalkyl (R _f) groups] thin films was characterized by grazing-incidence X-ray diffraction (GIXD). In-plane diffractions corresponding to the hexagonal packing of the R_f groups were measured for PFA-C_y with y ≥ 8 in the surface and bulk regions. This result indicated that the R_f groups were oriented almost perpendicular to the film surface.

本文言語	英語
ページ（範囲）	1024-1025
ページ数	2
ジャーナル	Chemistry Letters
巻	34
号	7
DOI	https://doi.org/10.1246/cl.2005.1024
出版ステータス	出版済み - 7月 5 2005

!!!All Science Journal Classification (ASJC) codes

化学一般

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10.1246/cl.2005.1024

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引用スタイル

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abstract = "Molecular aggregation structure of poly(fluoroalkyl acrylate) [PFA-C y, where y is the fluoromethylene number of the fluoroalkyl (R f) groups] thin films was characterized by grazing-incidence X-ray diffraction (GIXD). In-plane diffractions corresponding to the hexagonal packing of the Rf groups were measured for PFA-Cy with y ≥ 8 in the surface and bulk regions. This result indicated that the Rf groups were oriented almost perpendicular to the film surface.",

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AU - Honda, Koji

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AU - Koga, Tomoyuki

AU - Sasaki, Sono

AU - Sakata, Osami

AU - Otsuka, Hideyuki

AU - Takahara, Atsushi

PY - 2005/7/5

Y1 - 2005/7/5

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AB - Molecular aggregation structure of poly(fluoroalkyl acrylate) [PFA-C y, where y is the fluoromethylene number of the fluoroalkyl (R f) groups] thin films was characterized by grazing-incidence X-ray diffraction (GIXD). In-plane diffractions corresponding to the hexagonal packing of the Rf groups were measured for PFA-Cy with y ≥ 8 in the surface and bulk regions. This result indicated that the Rf groups were oriented almost perpendicular to the film surface.

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