Malfunction mechanism of semiconductor circuit breaker in HVDC power supply system

Seiya Abe, Kentaro Fukushima, Sihun Yang, Mariko Ogawa, Kosuke Nomura, Masahito Shoyama, Tamotsu Ninomiya, Akira Matsumoto, Akiyoshi Fukui, Mikio Yamasaki

研究成果: 書籍/レポート タイプへの寄稿会議への寄与

1 被引用数 (Scopus)

抄録

This paper considers the malfunction mechanism of semiconductor circuit breaker in high voltage DC power supply system (HVDC). In HVDC system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction is happened, unexpected large current is flown to the other normal line. In this paper, the malfunction mechanism of semiconductor circuit breaker is considered. It demonstrated by using MATLAB/Simulink. Moreover, the demonstrated results are confirmed by experimentally.

本文言語英語
ホスト出版物のタイトル2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings
ページ3733-3738
ページ数6
DOI
出版ステータス出版済み - 2010
イベント2010 2nd IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Atlanta, GA, 米国
継続期間: 9月 12 20109月 16 2010

出版物シリーズ

名前2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings

その他

その他2010 2nd IEEE Energy Conversion Congress and Exposition, ECCE 2010
国/地域米国
CityAtlanta, GA
Period9/12/109/16/10

!!!All Science Journal Classification (ASJC) codes

  • エネルギー工学および電力技術
  • 再生可能エネルギー、持続可能性、環境

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