TY - GEN
T1 - Levels of detail control based on correlation analysis between surface position and direction
AU - Tsuji, Tokuo
AU - Zha, Hongbin
AU - Hasegawa, Tsutomu
AU - Kurazume, Ryo
PY - 2004
Y1 - 2004
N2 - This paper presents a new LOD control method using surface smoothness measure based on correlation analysis between surface position and direction. This control method renders smooth surface with less data. We also describe a new method of generating hierarchical data structures of face clusters.
AB - This paper presents a new LOD control method using surface smoothness measure based on correlation analysis between surface position and direction. This control method renders smooth surface with less data. We also describe a new method of generating hierarchical data structures of face clusters.
UR - http://www.scopus.com/inward/record.url?scp=10044252051&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=10044252051&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2004.1334606
DO - 10.1109/ICPR.2004.1334606
M3 - Conference contribution
AN - SCOPUS:10044252051
SN - 0769521282
T3 - Proceedings - International Conference on Pattern Recognition
SP - 622
EP - 625
BT - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
A2 - Kittler, J.
A2 - Petrou, M.
A2 - Nixon, M.
T2 - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
Y2 - 23 August 2004 through 26 August 2004
ER -