TY - JOUR
T1 - Investigation on transport properties of strained La 0.85 Ba 0.15 MnO 3 thin films using hall measurement
AU - Kanki, Teruo
AU - Yanagida, Takeshi
AU - Vilquin, Bertrand
AU - Tanaka, Hidekazu
AU - Kawai, Tomoji
N1 - Funding Information:
This work was supported by PRESTO in Japan Science and Technology Corporation. T. Kanki, T. Yanagida and B. Vilquin gratefully acknowledge financial support from the Japan Society for the Promotion of Science (JSPS).
PY - 2005/5/15
Y1 - 2005/5/15
N2 - La 1-x Ba x MnO 3 thin films (0.05 ≤ x ≤ 0.2) with a tensile strain from substrate exhibit unusual film thickness dependence on the Curie temperature T C . The T C was found to increase up to room temperature with decreasing film thickness. In this study, the origin of the T C enhancement is examined by performing Hall measurements. The carrier densities of various thick films were found to be almost constant value (∼6 × 10 20 cm -3 ) at 10 K, whereas Hall mobility drastically increased, from 5 cm 2 /V s for 729-nm thick film to 50 cm 2 /V s for 24-nm thick film. These results indicate that the T C enhancement is induced by increase of carrier transfer due to lattice deformation of Mn-O-Mn networks.
AB - La 1-x Ba x MnO 3 thin films (0.05 ≤ x ≤ 0.2) with a tensile strain from substrate exhibit unusual film thickness dependence on the Curie temperature T C . The T C was found to increase up to room temperature with decreasing film thickness. In this study, the origin of the T C enhancement is examined by performing Hall measurements. The carrier densities of various thick films were found to be almost constant value (∼6 × 10 20 cm -3 ) at 10 K, whereas Hall mobility drastically increased, from 5 cm 2 /V s for 729-nm thick film to 50 cm 2 /V s for 24-nm thick film. These results indicate that the T C enhancement is induced by increase of carrier transfer due to lattice deformation of Mn-O-Mn networks.
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U2 - 10.1016/j.apsusc.2004.09.154
DO - 10.1016/j.apsusc.2004.09.154
M3 - Conference article
AN - SCOPUS:15844424857
SN - 0169-4332
VL - 244
SP - 481
EP - 484
JO - Applied Surface Science
JF - Applied Surface Science
IS - 1-4
T2 - 12th International Conference on Solid Films and Surfaces
Y2 - 21 June 2004 through 25 June 2004
ER -