Increase in emission current after high-frequency low-voltage pulse application observed for nano-pillar cathode

Tomoya Yoshida, Akiyoshi Baba, Tanemasa Asano

研究成果: 書籍/レポート タイプへの寄稿会議への寄与

抄録

The increase in emission current after high-frequency low-voltage pulse application to the ion-beam modified organic nano-pillar cold cathode was investigated. It was found that the method was effective to increase the number of emission site without destruction of emitter tip, as the transient current induces heat even at inactive emitter tip. High-frequency low-voltage pulse application increases the number of emission site due to rise in temperature caused by transient current flowing during the application of the pulses. The results also indicated that temperature at the emitter does not rise enough to remove contamination when the frequency was low, as the heat diffusion is higher than the heat generation by transient current.

本文言語英語
ホスト出版物のタイトルTechnical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004
編集者A.I. Akinwande, L.-Y. Chen, I. Kymissis, C.-Y. Hong
ページ258-259
ページ数2
出版ステータス出版済み - 2004
イベントTechnical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004 - Cambridge, MA, 米国
継続期間: 7月 11 20047月 16 2004

出版物シリーズ

名前Technical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004

その他

その他Technical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004
国/地域米国
CityCambridge, MA
Period7/11/047/16/04

!!!All Science Journal Classification (ASJC) codes

  • 工学一般

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