In-situ electronic conductivity measurements of LiNi_0.45Mn_1.485Cr_0.05O₄ thin films using all-solid-state thin-film batteries

Total electronic conductivity (σ_e^total) of LiNi_0.45Mn_1.485Cr_0.05O₄ thin film (LNM–Cr: 40 nm in thickness) between 3.5 and 4.9 V (vs. Li metal anode) was measured using all-solid-state thin-film battery (Li/LiPON/LPO/LNM–Cr) fabricated on interdigitated array (IDA) electrode. The LNM–Cr with disordered spinel phase was prepared by pulsed laser deposition on the IDA electrode. The σ_e^total depended on the voltage and reversibly changed regardless of lithium extraction/insertion process. Variation trends of the σ_e^total were in good agreement with the previous reports using the chemically delithiated powder materials. Grain boundary resistance contributes to the σ_e^total depending on the voltage probably because of the formation of double Schottky barrier at the grain boundaries.