Imaging of charged micropatterned monolayer surfaces by chemical force microscopy

Chemical force microscopy (CFM) was applied for the lateral force microscopic imaging of micropatterned organosilane monolayer surfaces with oppositely charged phases using chemically modified cantilever tips. Chemically modified cantilever tips with oxidized mercaptosilane, aminosilane, and unmodified cantilever tip were employed as a tip for CFM. Lateral force imaging of the micropatterned surface with opposite charge was successfully achieved by controlling the pH of the aqueous solution in consideration of the electrostatic condition of functional groups on the cantilever tip and substrate surface.