Final test at the surface of the ATLAS endcap muon trigger chamber electronics

T. Kubota; M. Ishino; N. Kanaya; T. Kawamoto; T. Kobayashi; T. Kuwabara; H. Nomoto; H. Sakamoto; T. Yamaguchi; C. Fukunaga; M. Ikeno; H. Iwasaki; K. Nagano; M. Nozaki; O. Sasaki; S. Tanaka; Y. Yasu; Y. Hasegawa; H. Oshita; T. Takeshita; M. Nomachi; Y. Sugaya; T. Sugimoto; Y. Okumura; Y. Takahashi; M. Tomoto; T. Kadosaka; K. Kawagoe; H. Kiyamura; H. Kurashige; T. Niwa; A. Ochi; C. Omachi; H. Takeda; R. Lifshitz; N. Lupu; S. Bressler; S. Tarem; E. Kajomovitz; S. Ben Ami; O. Bahat Treidel; Y. Benhammou; E. Etzion; D. Lellouch; L. Levinson; G. Mikenberg; A. Roich

Final test at the surface of the ATLAS endcap muon trigger chamber electronics

T. Kubota, M. Ishino, N. Kanaya, T. Kawamoto, T. Kobayashi, T. Kuwabara, H. Nomoto, H. Sakamoto, T. Yamaguchi, C. Fukunaga, M. Ikeno, H. Iwasaki, K. Nagano, M. Nozaki, O. Sasaki, S. Tanaka, Y. Yasu, Y. Hasegawa, H. Oshita, T. TakeshitaM. Nomachi, Y. Sugaya, T. Sugimoto, Y. Okumura, Y. Takahashi, M. Tomoto, T. Kadosaka, K. Kawagoe, H. Kiyamura, H. Kurashige, T. Niwa, A. Ochi, C. Omachi, H. Takeda, R. Lifshitz, N. Lupu, S. Bressler, S. Tarem, E. Kajomovitz, S. Ben Ami, O. Bahat Treidel, Y. Benhammou, E. Etzion, D. Lellouch, L. Levinson, G. Mikenberg, A. Roich

研究成果: 書籍/レポートタイプへの寄稿 › 会議への寄与

抄録

For the detector commissioning planned in 2007, sector assembly of the ATLAS muon-endcap trigger chambers and final test at the surface for the assembled electronics are being done in CERN and almost completed. For the test, we built up the Data Acquisition (DAQ) system using test pulse of two types and cosmic rays in order to check functionality of the various aspects of the electronics mounted on a sector. So far, 99% of all 320,000 channels have been tested and most of them were installed into the ATLAS cavern. In this presentation, we will describe the DAQ systems and mass-test procedure in detail, and report the result of electronics test with some actual experiences.

本文言語	英語
ホスト出版物のタイトル	Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007
ページ	463-467
ページ数	5
出版ステータス	出版済み - 2007
外部発表	はい
イベント	Topical Workshop on Electronics for Particle Physics, TWEPP 2007 - Prague, チェコ共和国継続期間: 9月 3 2007 → 9月 7 2007

出版物シリーズ

名前	Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007

その他

その他	Topical Workshop on Electronics for Particle Physics, TWEPP 2007
国/地域	チェコ共和国
City	Prague
Period	9/3/07 → 9/7/07

!!!All Science Journal Classification (ASJC) codes

核物理学および高エネルギー物理学

他のファイルとリンク

引用スタイル

Kubota, T., Ishino, M., Kanaya, N., Kawamoto, T., Kobayashi, T., Kuwabara, T., Nomoto, H., Sakamoto, H., Yamaguchi, T., Fukunaga, C., Ikeno, M., Iwasaki, H., Nagano, K., Nozaki, M., Sasaki, O., Tanaka, S., Yasu, Y., Hasegawa, Y., Oshita, H., ... Roich, A. (2007). Final test at the surface of the ATLAS endcap muon trigger chamber electronics. In Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007 (pp. 463-467). (Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007).

Final test at the surface of the ATLAS endcap muon trigger chamber electronics. / Kubota, T.; Ishino, M.; Kanaya, N. その他.
Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007. 2007. p. 463-467 (Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007).

研究成果: 書籍/レポートタイプへの寄稿 › 会議への寄与

Kubota, T, Ishino, M, Kanaya, N, Kawamoto, T, Kobayashi, T, Kuwabara, T, Nomoto, H, Sakamoto, H, Yamaguchi, T, Fukunaga, C, Ikeno, M, Iwasaki, H, Nagano, K, Nozaki, M, Sasaki, O, Tanaka, S, Yasu, Y, Hasegawa, Y, Oshita, H, Takeshita, T, Nomachi, M, Sugaya, Y, Sugimoto, T, Okumura, Y, Takahashi, Y, Tomoto, M, Kadosaka, T, Kawagoe, K, Kiyamura, H, Kurashige, H, Niwa, T, Ochi, A, Omachi, C, Takeda, H, Lifshitz, R, Lupu, N, Bressler, S, Tarem, S, Kajomovitz, E, Ben Ami, S, Bahat Treidel, O, Benhammou, Y, Etzion, E, Lellouch, D, Levinson, L, Mikenberg, G & Roich, A 2007, Final test at the surface of the ATLAS endcap muon trigger chamber electronics. in Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007. Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007, pp. 463-467, Topical Workshop on Electronics for Particle Physics, TWEPP 2007, Prague, チェコ共和国, 9/3/07.

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abstract = "For the detector commissioning planned in 2007, sector assembly of the ATLAS muon-endcap trigger chambers and final test at the surface for the assembled electronics are being done in CERN and almost completed. For the test, we built up the Data Acquisition (DAQ) system using test pulse of two types and cosmic rays in order to check functionality of the various aspects of the electronics mounted on a sector. So far, 99% of all 320,000 channels have been tested and most of them were installed into the ATLAS cavern. In this presentation, we will describe the DAQ systems and mass-test procedure in detail, and report the result of electronics test with some actual experiences.",

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AU - Kubota, T.

AU - Ishino, M.

AU - Kanaya, N.

AU - Kawamoto, T.

AU - Kobayashi, T.

AU - Kuwabara, T.

AU - Nomoto, H.

AU - Sakamoto, H.

AU - Yamaguchi, T.

AU - Fukunaga, C.

AU - Ikeno, M.

AU - Iwasaki, H.

AU - Nagano, K.

AU - Nozaki, M.

AU - Sasaki, O.

AU - Tanaka, S.

AU - Yasu, Y.

AU - Hasegawa, Y.

AU - Oshita, H.

AU - Takeshita, T.

AU - Nomachi, M.

AU - Sugaya, Y.

AU - Sugimoto, T.

AU - Okumura, Y.

AU - Takahashi, Y.

AU - Tomoto, M.

AU - Kadosaka, T.

AU - Kawagoe, K.

AU - Kiyamura, H.

AU - Kurashige, H.

AU - Niwa, T.

AU - Ochi, A.

AU - Omachi, C.

AU - Takeda, H.

AU - Lifshitz, R.

AU - Lupu, N.

AU - Bressler, S.

AU - Tarem, S.

AU - Kajomovitz, E.

AU - Ben Ami, S.

AU - Bahat Treidel, O.

AU - Benhammou, Y.

AU - Etzion, E.

AU - Lellouch, D.

AU - Levinson, L.

AU - Mikenberg, G.

AU - Roich, A.

PY - 2007

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AB - For the detector commissioning planned in 2007, sector assembly of the ATLAS muon-endcap trigger chambers and final test at the surface for the assembled electronics are being done in CERN and almost completed. For the test, we built up the Data Acquisition (DAQ) system using test pulse of two types and cosmic rays in order to check functionality of the various aspects of the electronics mounted on a sector. So far, 99% of all 320,000 channels have been tested and most of them were installed into the ATLAS cavern. In this presentation, we will describe the DAQ systems and mass-test procedure in detail, and report the result of electronics test with some actual experiences.

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T3 - Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007

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BT - Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2007

T2 - Topical Workshop on Electronics for Particle Physics, TWEPP 2007

Y2 - 3 September 2007 through 7 September 2007

ER -

Final test at the surface of the ATLAS endcap muon trigger chamber electronics

抄録

出版物シリーズ

その他

!!!All Science Journal Classification (ASJC) codes

他のファイルとリンク

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