TY - GEN
T1 - Fabrication of nano-gap electrodes using ultrathin metal film
AU - Miyazaki, T.
AU - Kobayashi, K.
AU - Ishida, K.
AU - Horiuchi, T.
AU - Yamada, H.
AU - Matsushige, K.
N1 - Publisher Copyright:
© 2002 IEEE.
PY - 2002
Y1 - 2002
N2 - Organic molecules have attracted a great deal of attention because of their promising applications to electronics. Many researchers have recently studied electrical properties of ultrathin molecular films for the developments of molecular electronic devices (MEDs). Since electrical junctions between the metallic electrode and the molecular film are directly related to the carrier injection in the device, the nanoscale investigations of molecular structures and electrical properties at the metal/molecular film interface is indispensable. Scanning probe microscopy techniques are remarkably suitable methods for such investigations. However, it is often difficult to bring the probe tip in the close proximity of the electrode edge because of a large difference in height between the electrode and the ultrathin molecular film with the typical thickness of a few nm, which prevents us from the nanoscale investigations of the metal/molecular-film interface. In this study, for overcoming the difficulty we fabricated Pt nano-gap electrodes having a molecular-scale thickness and atomical flatness. We investigated the structures and the electrical properties of the molecular films at the electrode edge using atomic force microscopy (AFM) and Kelvin force microscopy.
AB - Organic molecules have attracted a great deal of attention because of their promising applications to electronics. Many researchers have recently studied electrical properties of ultrathin molecular films for the developments of molecular electronic devices (MEDs). Since electrical junctions between the metallic electrode and the molecular film are directly related to the carrier injection in the device, the nanoscale investigations of molecular structures and electrical properties at the metal/molecular film interface is indispensable. Scanning probe microscopy techniques are remarkably suitable methods for such investigations. However, it is often difficult to bring the probe tip in the close proximity of the electrode edge because of a large difference in height between the electrode and the ultrathin molecular film with the typical thickness of a few nm, which prevents us from the nanoscale investigations of the metal/molecular-film interface. In this study, for overcoming the difficulty we fabricated Pt nano-gap electrodes having a molecular-scale thickness and atomical flatness. We investigated the structures and the electrical properties of the molecular films at the electrode edge using atomic force microscopy (AFM) and Kelvin force microscopy.
UR - https://www.scopus.com/pages/publications/84960402026
UR - https://www.scopus.com/pages/publications/84960402026#tab=citedBy
U2 - 10.1109/IMNC.2002.1178590
DO - 10.1109/IMNC.2002.1178590
M3 - Conference contribution
AN - SCOPUS:84960402026
T3 - 2002 International Microprocesses and Nanotechnology Conference, MNC 2002
SP - 154
EP - 155
BT - 2002 International Microprocesses and Nanotechnology Conference, MNC 2002
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - International Microprocesses and Nanotechnology Conference, MNC 2002
Y2 - 6 November 2002 through 8 November 2002
ER -