Estimating error in measuring thermal conductivity using a T-type nanosensor

Yohei Ito, Koji Takahashi, Motoo Fujii, Xing Zhang

研究成果: ジャーナルへの寄稿学術誌査読

5 被引用数 (Scopus)

抄録

We discuss the measurement error caused by fabrication and measurement of a T-type nanosensor with a suspended sub-micrometer Pt hot film that was developed to measure the thermal properties of individual nanowire materials. Comparison of numerical simulation and one-dimensional analysis revealed that the thermal conductivity of nanowire material such as a carbon nanotube is calculated to be 17% lower. As an example, the thermal conductivity measurement result for a SiC nanowire is reported. The error caused by contact thermal resistance is found to depend on the contact length and can be as great as 20%. It can be said that future measuring can have higher reliability by correcting the estimated measurement error.

本文言語英語
ページ(範囲)297-312
ページ数16
ジャーナルHeat Transfer - Asian Research
38
5
DOI
出版ステータス出版済み - 7月 2009

!!!All Science Journal Classification (ASJC) codes

  • 凝縮系物理学
  • 流体および伝熱

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