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EPITAXIAL RELATIONS IN FLUORIDE FILMS GROWN ON GaAs left brace 111 right brace AND Ge(111) SUBSTRATES.

  • K. Tsutsui
  • , H. Ishiwara
  • , T. Asano
  • , S. Furukawa

研究成果: 書籍/レポート タイプへの寄稿 › 会議への寄与

抄録

Epitaxial relations in Ca//x Sr//1//-//xF//2(0 less than equivalent to x less than equivalent to 1) and BaF//2 films grown on GaAs and Ge substrates were investigated by He ion channeling analysis and transmission electron microscopy. Though the lattice constants of GaAs and Ge are nearly the same, the relations were found to be completely different: the fluoride films on GaAs preferred to have an orientation identical to that of the substrate (type A orientation), whereas the orientation of the films on Ge was mainly rotated by 180 degree about the surface normal LT AN BR 111 RT AN BR axis (type B orientation). A hypothesis is proposed that the epitaxial relations in these systems are affected by the ionicity of the substrate as well as the lattice matching condition.

本文言語英語
ホスト出版物のタイトルMaterials Research Society Symposia Proceedings
編集者Carolyn Rubin Aita, K.S. SreeHarsha
出版社Materials Research Soc
ページ93-98
ページ数6
ISBN(印刷版)093183712X
出版ステータス出版済み - 1985
外部発表はい

出版物シリーズ

名前Materials Research Society Symposia Proceedings
巻47
ISSN(印刷版)0272-9172

!!!All Science Journal Classification (ASJC) codes

  • 材料科学一般
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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