TY - JOUR
T1 - Enhancement of hydrogen isotope retention in tungsten exposed to LHD plasmas
AU - Oya, Yasuhisa
AU - Masuzaki, Suguru
AU - Fujishima, Tetsuo
AU - Tokitani, Masayuki
AU - Yoshida, Naoaki
AU - Watanabe, Hideo
AU - Yamauchi, Yuji
AU - Hino, Tomoaki
AU - Miyamoto, Mitsutaka
AU - Hatano, Yuji
AU - Okuno, Kenji
N1 - Funding Information:
This study has been supported by NIFS collaboration program No. NIFS11KNWF001, JSPS Kakenhi No. 22360389 from MEXT, Japan, and the Center for Instrumental Analysis at Shizuoka University.
PY - 2013
Y1 - 2013
N2 - Tungsten (W) samples, undamaged and damaged by irradiation with 2.4 MeV Cu, were placed flush to the first wall of Large Helical Device (LHD) nearby the divertor target, and were exposed to 134 shots of hydrogen plasma discharges. Thereafter, to evaluate the enhancement of hydrogen isotope retention for W due to LHD hydrogen (H) plasma exposures, the W samples with and without LHD H plasma exposures were implanted with 1.0 keV D2+. For W samples without LHD H plasma exposures, the D retention in the damaged W was by a factor of ∼6 higher than that in the undamaged W. After LHD H plasma exposures, the carbon layers ∼4 nm in thickness were deposited on the W surfaces. Due to trapping of D atoms in the carbon layers, the D retention enhancement for undamaged and damaged W samples exposed to LHD H plasmas was significantly higher than that for the W samples without LHD H plasma exposures.
AB - Tungsten (W) samples, undamaged and damaged by irradiation with 2.4 MeV Cu, were placed flush to the first wall of Large Helical Device (LHD) nearby the divertor target, and were exposed to 134 shots of hydrogen plasma discharges. Thereafter, to evaluate the enhancement of hydrogen isotope retention for W due to LHD hydrogen (H) plasma exposures, the W samples with and without LHD H plasma exposures were implanted with 1.0 keV D2+. For W samples without LHD H plasma exposures, the D retention in the damaged W was by a factor of ∼6 higher than that in the undamaged W. After LHD H plasma exposures, the carbon layers ∼4 nm in thickness were deposited on the W surfaces. Due to trapping of D atoms in the carbon layers, the D retention enhancement for undamaged and damaged W samples exposed to LHD H plasmas was significantly higher than that for the W samples without LHD H plasma exposures.
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U2 - 10.1016/j.jnucmat.2013.01.231
DO - 10.1016/j.jnucmat.2013.01.231
M3 - Article
AN - SCOPUS:84885428545
SN - 0022-3115
VL - 438
SP - S1055-S1058
JO - Journal of Nuclear Materials
JF - Journal of Nuclear Materials
IS - SUPPL
ER -