抄録
A new electric data acquisition and operational control system was developed for time-of-flight sputtered neutral mass spectrometry (TOF-SNMS). The system is designed for high-speed data acquisition, data processing, and data streaming. The developed system is constructed on an NI-PXI platform and provides timing clocks for the TOF-SNMS operation. The system performs data processing of noise suppression and ion counting while acquiring TOF mass spectrum for 13-microsecond length at sampling rate of 3 GS/s for every 1 millisecond. In addition, the system acquires and records TOF mass spectrum of 60-microsecond length at sampling rate of 3 GS/s for every 1 millisecond without data processing. The system detects single ion signals from accumulated TOF mass spectrum of 107 times and counts up to 10 ions accurately from a single event of TOF mass spectrum.
| 本文言語 | 英語 |
|---|---|
| ページ(範囲) | 35-39 |
| ページ数 | 5 |
| ジャーナル | Surface and Interface Analysis |
| 巻 | 51 |
| 号 | 1 |
| DOI | |
| 出版ステータス | 出版済み - 1月 2019 |
!!!All Science Journal Classification (ASJC) codes
- 化学一般
- 凝縮系物理学
- 表面および界面
- 表面、皮膜および薄膜
- 材料化学
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