Electron microscopy of materials modification induced by tokamak plasma

K. Tokunaga; T. Muroga; Y. Miyamoto; T. Fujiwara; N. Yoshida; K. Nakamura; N. Hiraki; S. Itoh

doi:10.1016/0022-3115(91)90099-S

Electron microscopy of materials modification induced by tokamak plasma

K. Tokunaga
, T. Muroga
, Y. Miyamoto
, T. Fujiwara
, N. Yoshida
, K. Nakamura
, N. Hiraki
, S. Itoh

核融合力学部門

研究成果: ジャーナルへの寄稿 › 学術誌 › 査読

7 被引用数 (Scopus)

抄録

In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.

本文言語	英語
ページ（範囲）	356-359
ページ数	4
ジャーナル	Journal of Nuclear Materials
巻	179-181
号	PART 1
DOI	https://doi.org/10.1016/0022-3115(91)90099-S
出版ステータス	出版済み - 1991

!!!All Science Journal Classification (ASJC) codes

核物理学および高エネルギー物理学
材料科学一般
原子力エネルギーおよび原子力工学

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10.1016/0022-3115(91)90099-S

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引用スタイル

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title = "Electron microscopy of materials modification induced by tokamak plasma",

abstract = "In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.",

author = "K. Tokunaga and T. Muroga and Y. Miyamoto and T. Fujiwara and N. Yoshida and K. Nakamura and N. Hiraki and S. Itoh",

year = "1991",

doi = "10.1016/0022-3115(91)90099-S",

language = "English",

volume = "179-181",

pages = "356--359",

journal = "Journal of Nuclear Materials",

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TY - JOUR

T1 - Electron microscopy of materials modification induced by tokamak plasma

AU - Tokunaga, K.

AU - Muroga, T.

AU - Miyamoto, Y.

AU - Fujiwara, T.

AU - Yoshida, N.

AU - Nakamura, K.

AU - Hiraki, N.

AU - Itoh, S.

PY - 1991

Y1 - 1991

N2 - In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.

AB - In order to investigate fundamental processes of plasma-wall interactions of tokamak devices, specimens for Transmission Electron Microscope (TEM) observation were exposed to plasma of High-Field Tokamak TRIAM-1. TEM or SEM observation showed an initial process of droplet ejection from molten surfaces and low energy hydrogen-induced microstructures. Mechanisms of the damage processes observed and their implication to wall/limiter performance were discussed.

UR - https://www.scopus.com/pages/publications/0343423919

UR - https://www.scopus.com/pages/publications/0343423919#tab=citedBy

U2 - 10.1016/0022-3115(91)90099-S

DO - 10.1016/0022-3115(91)90099-S

M3 - Article

AN - SCOPUS:0343423919

SN - 0022-3115

VL - 179-181

SP - 356

EP - 359

JO - Journal of Nuclear Materials

JF - Journal of Nuclear Materials

IS - PART 1

ER -

Electron microscopy of materials modification induced by tokamak plasma

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!!!All Science Journal Classification (ASJC) codes

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