抄録
This paper describes the fabrication of scanning probes with single metal nanowires (NWs) at the probe tip. The porous-template technique can produce NWs of various kinds of metals, with diameters down to 10-20 nm, which compete with multiwall carbon nanotube diameters. Metal NWs are grown by electrodeposition on the scanning probe tip. One NW can be selected to remain by focused ion beam technique. A variety of metals can be chosen as the tip material. Electric potentials of NWs at the probe tip can be measured. Single NW probes can measure surface topographies, electrode potentials, and their mechanical bending properties.
本文言語 | 英語 |
---|---|
ページ(範囲) | 3556-3566 |
ページ数 | 11 |
ジャーナル | ACS nano |
巻 | 8 |
号 | 4 |
DOI | |
出版ステータス | 出版済み - 4月 22 2014 |
外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 材料科学一般
- 工学一般
- 物理学および天文学一般