TY - GEN
T1 - Electrodeposited metallic nanowires as a scanning probe tip
AU - Motoyama, Munekazu
AU - Prinz, Friedrich B.
PY - 2010
Y1 - 2010
N2 - This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.
AB - This paper describes lateral deformations of electrodeposited Ni nanowires as an atomic force microscope (AFM) probe tip. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.
UR - http://www.scopus.com/inward/record.url?scp=77957765659&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77957765659&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:77957765659
SN - 9781617387609
T3 - Materials Research Society Symposium Proceedings
SP - 34
EP - 39
BT - Multifunction at the Nanoscale through Nanowires
T2 - 2009 MRS Fall Meeting
Y2 - 30 November 2009 through 4 December 2009
ER -