Test data modification based on test relaxation and Xfilling is the preferred approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlled X-Identification (DC-XID), which controls the distribution of X-bits identified in a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experiments on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without lowering fault coverage, increasing test data volume and circuit size.
!!!All Science Journal Classification (ASJC) codes
- コンピュータ ビジョンおよびパターン認識