Dislocation structure misorientations measured with an automated electron diffraction pattern indexing tool

G. Shigesato; E. F. Rauch

doi:10.1016/j.msea.2005.12.112

Dislocation structure misorientations measured with an automated electron diffraction pattern indexing tool

G. Shigesato, E. F. Rauch

研究成果: ジャーナルへの寄稿 › 学術誌 › 査読

15 被引用数 (Scopus)

抄録

The substructures of deformed Fe-1.5%Cu alloys are investigated by use of a transmission electron microscope (TEM). The aspect of the substructure as observed in classical bright-field mode is compared with the average misorientation gradient deduced from orientation maps collected with an automated diffraction pattern indexing tool. It is shown that a significant part of the dislocation boundaries are not detectable through misorientation measurements.

本文言語	英語
ページ（範囲）	402-406
ページ数	5
ジャーナル	Materials Science and Engineering: A
巻	462
号	1-2
DOI	https://doi.org/10.1016/j.msea.2005.12.112
出版ステータス	出版済み - 7月 25 2007
外部発表	はい

!!!All Science Journal Classification (ASJC) codes

材料科学一般
凝縮系物理学
材料力学
機械工学

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10.1016/j.msea.2005.12.112

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AB - The substructures of deformed Fe-1.5%Cu alloys are investigated by use of a transmission electron microscope (TEM). The aspect of the substructure as observed in classical bright-field mode is compared with the average misorientation gradient deduced from orientation maps collected with an automated diffraction pattern indexing tool. It is shown that a significant part of the dislocation boundaries are not detectable through misorientation measurements.

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Dislocation structure misorientations measured with an automated electron diffraction pattern indexing tool

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!!!All Science Journal Classification (ASJC) codes

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