Development of high-resolution and light-weight x-ray optics with deformed silicon wafers

Physics

• Wafer 80%
• Plastic Deformation 60%
• High Resolution 40%
• X Ray 40%
• Deformation 40%
• Stability 20%
• Silicon 20%
• Surface Roughness 20%
• Degradation 20%
• Flat Surfaces 20%
• X Ray Telescopes 20%
• Curvature 20%
• X Ray Optics 20%
• Geometrical Optics 20%

Engineering

• Silicon Wafer 100%
• Development 40%
• Deformation 40%
• Highlight 40%
• High Resolution 40%
• Thickness 20%
• Stability 20%
• Promising Candidate 20%
• Accuracy 20%
• Flat Surface 20%
• Curvature Radius 20%
• Surface Quality 20%

Material Science

• Silicon Wafer 100%
• Elastic Deformation 60%
• Surface Property 20%
• Reflectivity 20%