Development of double-probe piezo-driving holder for TEM

研究成果: ジャーナルへの寄稿 › 学術誌 › 査読

本文言語	英語
ページ（範囲）	814-815
ページ数	2
ジャーナル	Microscopy and Microanalysis
巻	14
号	SUPPL. 2
DOI	https://doi.org/10.1017/S1431927608083165
出版ステータス	出版済み - 8月 2008
外部発表	はい

!!!All Science Journal Classification (ASJC) codes

@article{111d4395c00546138944ec8418c3cf0b,

title = "Development of double-probe piezo-driving holder for TEM",

author = "K. Yamazaki and I. Ishikawa and S. Deguchi and Y. Kondo and Y. Murakami and D. Shindo",

year = "2008",

month = aug,

doi = "10.1017/S1431927608083165",

language = "English",

volume = "14",

pages = "814--815",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Development of double-probe piezo-driving holder for TEM

AU - Yamazaki, K.

AU - Ishikawa, I.

AU - Deguchi, S.

AU - Kondo, Y.

AU - Murakami, Y.

AU - Shindo, D.

PY - 2008/8

Y1 - 2008/8

UR - https://www.scopus.com/pages/publications/49649116453

UR - https://www.scopus.com/pages/publications/49649116453#tab=citedBy

U2 - 10.1017/S1431927608083165

DO - 10.1017/S1431927608083165

M3 - Article

AN - SCOPUS:49649116453

SN - 1431-9276

VL - 14

SP - 814

EP - 815

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -