@inproceedings{c7960dcaf47b4287b33b1df9f4b62325,
title = "Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation",
abstract = "We are developing a novel Bragg reflection X-ray polarimeter using hot plastic deformation of silicon wafers. A Bragg reflection polarimeter has the advantage of simple principle and large modulation factor but suffers from the disadvantage of a narrow detectable energy band and difficulty to focus an incident beam. We overcome these disadvantages by bending a silicon wafer at high temperature. The bent Bragg reflection polarimeter have a wide energy band using different angles on the wafer and enable focusing. We have succeeded in measuring X-ray polarization with this method for the first time using a sample optic made from a 4-inch silicon (100) wafer.",
author = "Y. Ueda and T. Uchino and D. Ishi and Y. Ezoe and K. Ishikawa and M. Numazawa and A. Fukushima and S. Sakuda and A. Inagaki and H. Morishita and L. Sekiguchi and T. Murakawa and Y. Tsuji and K. Mitsuda and K. Morishita and K. Nakajima",
note = "Publisher Copyright: {\textcopyright} 2022 SPIE. All rights reserved.; Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray ; Conference date: 17-07-2022 Through 22-07-2022",
year = "2022",
doi = "10.1117/12.2629635",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "{den Herder}, {Jan-Willem A.} and Shouleh Nikzad and Kazuhiro Nakazawa",
booktitle = "Space Telescopes and Instrumentation 2022",
address = "United States",
}