Design and implementation of a non-destructive test circuit for SiC-MOSFETs

Engineering

• Power Device 100%
• Experimental Result 40%
• Test Circuit 40%
• Non-Destructive Test 40%
• Short Circuit 20%
• Reliability 20%
• Power Density 10%
• Design 10%
• Networks (Circuits) 10%
• Power Converter 10%
• Improving Efficiency 10%
• Circuit Test 10%
• Extreme Condition 10%
• Inverter 10%

Physics

• Silicon Carbide 100%
• Field Effect Transistor 90%
• Nondestructive Test 40%
• Reliability 20%
• Short Circuit 20%
• Validity 10%
• Circuits 10%
• Double Diffusion 10%

Material Science

• Paper 10%