TY - GEN
T1 - Critical charge dependence of correlation of different neutron sources for soft error testing
AU - Mori, Hiroko
AU - Uemura, Taiki
AU - Matsuyama, Hideya
AU - Abe, Shin Ichiro
AU - Watanabe, Yukinobu
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/5/26
Y1 - 2015/5/26
N2 - We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.
AB - We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.
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U2 - 10.1109/IRPS.2015.7112678
DO - 10.1109/IRPS.2015.7112678
M3 - Conference contribution
AN - SCOPUS:84942940684
T3 - IEEE International Reliability Physics Symposium Proceedings
SP - 2C31-2C35
BT - 2015 IEEE International Reliability Physics Symposium, IRPS 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE International Reliability Physics Symposium, IRPS 2015
Y2 - 19 April 2015 through 23 April 2015
ER -