TY - JOUR
T1 - Continuous Measurement on Electric-Field Versus Current-Density Characteristics of REBCO Coated Conductors in the Electric-Field Window From 10-2Down to 10-11V/m
AU - Zeyu, Wu
AU - Higashikawa, Kohei
AU - Kiss, Takanobu
N1 - Funding Information:
This work was supported by Japan Society for the Promotion of Science (JSPS) KAKENHI under Grants JP19H05617, JP20H02132, and JP22K20430.
Publisher Copyright:
© 2002-2011 IEEE.
PY - 2023/8/1
Y1 - 2023/8/1
N2 - We have succeeded in measuring electric-field versus current-density (E-J) characteristics of REBCO coated conductors under external magnetic field over wide-range electric-field window from 10-2 down to 10-11 V/m continuously by combining both transport- and magnetization-relaxation-measurements. High-temperature superconductors (HTSs) can cover broad aspects of applications for AC and DC mode operation such as superconducting motors and persistent-mode MRI magnets. Electric field induced in these applications vary significantly from 10-2 down to 10-11 V/m depending on the operating frequency. This indicates that the corresponding critical current density (Jc) also varies due to the rounded E-J characteristics of HTS. Namely, it is inevitable to clarify the E-J characteristics in wide range of electric fields. In general, E-J characteristics are measured by current transport method or magnetization relaxation method. The standard transport measurement can cover typically from 10-2 down to around 10-5 to 10-4 V/m because of the limit of voltage noise, whereas in a DC magnetization measurement such that using SQUID magnetometer for example, the induced electric field during the measurement is around 10-8 V/m or less. In this study, we adopted Hall probe magnetic microscopy to expand the electric-field window in the measurements on E-J characteristics based on magnetization relaxation. We developed zero-dimensional fixed-point measurement with a time resolution less than 0.1 s to measure the initial decay of the magnetization, which extends the electric-field window up to similar level to that of transport measurement, i.e., at around 10-5 V/m. It was followed by a one-dimensional line scan in width-direction for the electric-field range between 10-8 to 10-11 V/m. Furthermore, 'flux annealing' method was adopted to access the electric-field range around 10-11 V/m with shorter measurement time.
AB - We have succeeded in measuring electric-field versus current-density (E-J) characteristics of REBCO coated conductors under external magnetic field over wide-range electric-field window from 10-2 down to 10-11 V/m continuously by combining both transport- and magnetization-relaxation-measurements. High-temperature superconductors (HTSs) can cover broad aspects of applications for AC and DC mode operation such as superconducting motors and persistent-mode MRI magnets. Electric field induced in these applications vary significantly from 10-2 down to 10-11 V/m depending on the operating frequency. This indicates that the corresponding critical current density (Jc) also varies due to the rounded E-J characteristics of HTS. Namely, it is inevitable to clarify the E-J characteristics in wide range of electric fields. In general, E-J characteristics are measured by current transport method or magnetization relaxation method. The standard transport measurement can cover typically from 10-2 down to around 10-5 to 10-4 V/m because of the limit of voltage noise, whereas in a DC magnetization measurement such that using SQUID magnetometer for example, the induced electric field during the measurement is around 10-8 V/m or less. In this study, we adopted Hall probe magnetic microscopy to expand the electric-field window in the measurements on E-J characteristics based on magnetization relaxation. We developed zero-dimensional fixed-point measurement with a time resolution less than 0.1 s to measure the initial decay of the magnetization, which extends the electric-field window up to similar level to that of transport measurement, i.e., at around 10-5 V/m. It was followed by a one-dimensional line scan in width-direction for the electric-field range between 10-8 to 10-11 V/m. Furthermore, 'flux annealing' method was adopted to access the electric-field range around 10-11 V/m with shorter measurement time.
UR - http://www.scopus.com/inward/record.url?scp=85151508083&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85151508083&partnerID=8YFLogxK
U2 - 10.1109/TASC.2023.3258375
DO - 10.1109/TASC.2023.3258375
M3 - Article
AN - SCOPUS:85151508083
SN - 1051-8223
VL - 33
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
IS - 5
M1 - 6601705
ER -