Application of the quantitative-phase and crystal-structure simultaneous analysis to the X-ray diffraction data obtained by synchrotron gandolfi camera system

Masahiko Tanaka, Tomoki Nakamura, Takaaki Noguchi

研究成果: 書籍/レポート タイプへの寄稿会議への寄与

1 被引用数 (Scopus)

抄録

Quantitative-phase and crystal-structure simultaneous analysis method has been successfully developed by applying the multi-phase Rietveld refinement to the diffraction data obtained by synchrotron Gandolfi camera system. This newly developed analytical method has been applied to diffraction experiments with micro-amount extraterrestrial samples, which the diameter is a hundred micrometers or less, and the mineral composition ratio of crystalline phase included in the sample has been successfully determined. As the crystal structure is also refined in Rietveld analysis by this method, the structural information of each mineral phase are simultaneously obtained. This method is a totally non-distractive quantitative-phase analysis method and will be a new and unique analytical method for planetary material science.

本文言語英語
ホスト出版物のタイトルSYNCHROTRON RADIATION INSTRUMENTATION
ホスト出版物のサブタイトルNinth International Conference on Synchrotron Radiation Instrumentation
ページ1779-1783
ページ数5
DOI
出版ステータス出版済み - 2007
外部発表はい
イベントSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, 韓国
継続期間: 5月 28 20066月 28 2006

出版物シリーズ

名前AIP Conference Proceedings
879
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

その他

その他SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
国/地域韓国
CityDaegu
Period5/28/066/28/06

!!!All Science Journal Classification (ASJC) codes

  • 物理学および天文学一般

フィンガープリント

「Application of the quantitative-phase and crystal-structure simultaneous analysis to the X-ray diffraction data obtained by synchrotron gandolfi camera system」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル