Zn-induced impurity levels in layer semiconductor InSe

S. Shigetomi, H. Ohkubo, T. Ikari, H. Nakashima

    Research output: Contribution to journalArticlepeer-review

    24 Citations (Scopus)

    Abstract

    The impurity levels in Zn-doped InSe have been investigated by photoluminescence (PL), Hall effect (HE), and deep-level transient spectroscopy (DLTS). Previous analysis by PL spectra shows that the radiative transition is dominated by donor-Zn acceptor pairs. In the present work, a search was made for the deep acceptor level using the combined data from HE and DLTS measurements. We find that the deep acceptor level, which is associated with defects or defect complexes formed by Zn atoms in the interlayer, is located about 0.6 eV above the valence band.

    Original languageEnglish
    Pages (from-to)3647-3650
    Number of pages4
    JournalJournal of Applied Physics
    Volume66
    Issue number8
    DOIs
    Publication statusPublished - 1989

    All Science Journal Classification (ASJC) codes

    • General Physics and Astronomy

    Fingerprint

    Dive into the research topics of 'Zn-induced impurity levels in layer semiconductor InSe'. Together they form a unique fingerprint.

    Cite this