XPS analysis of oxide films on lead-free solders with trace additions of Germanium and gallium

K. M. Watling; A. Chandler-Temple; K. Nogita

doi:10.4028/www.scientific.net/MSF.857.63

XPS analysis of oxide films on lead-free solders with trace additions of Germanium and gallium

K. M. Watling, A. Chandler-Temple, K. Nogita

Faculty of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

8 Citations (Scopus)

Abstract

A sessile drop experiment involving slow heating and cooling of lead-free solder alloys under inert gas revealed segregation of trace elements to the sample surface. Addition of germanium or gallium to Sn-0.7Cu-0.05Ni alloys promoted a metallic lustre in samples, in contrast with the blue/purple colour of the parent alloy. Alloys with Ge or Ga additions showed oxidation resistance. Depth profiling of surfaces of sample alloys with Ge or Ga showed a significant concentration of these elements within the oxide film, which may be responsible for oxidation resistance of these alloys.

Original language	English
Title of host publication	Advanced Materials Engineering and Technology IV
Editors	Mohd Mustafa Al Bakri Abdullah, Rafiza Abd Razak, Muhammad Faheem Mohd Tahir, Mohd Mustafa Al Bakri Abdullah, Rafiza Abd Razak, Liyana Jamaludin
Publisher	Trans Tech Publications Ltd
Pages	63-67
Number of pages	5
ISBN (Print)	9783035710205
DOIs	https://doi.org/10.4028/www.scientific.net/MSF.857.63
Publication status	Published - 2016
Event	International Conference on Advanced Materials Engineering and Technology, ICAMET 2015 - Kaohsiung, Taiwan, Province of China Duration: Dec 4 2015 → Dec 5 2015

Publication series

Name	Materials Science Forum
Volume	857
ISSN (Print)	0255-5476
ISSN (Electronic)	1662-9752

Other

Other	International Conference on Advanced Materials Engineering and Technology, ICAMET 2015
Country/Territory	Taiwan, Province of China
City	Kaohsiung
Period	12/4/15 → 12/5/15

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.4028/www.scientific.net/MSF.857.63

Cite this

Watling, K. M., Chandler-Temple, A., & Nogita, K. (2016). XPS analysis of oxide films on lead-free solders with trace additions of Germanium and gallium. In M. M. Al Bakri Abdullah, R. A. Razak, M. F. M. Tahir, M. M. Al Bakri Abdullah, R. A. Razak, & L. Jamaludin (Eds.), Advanced Materials Engineering and Technology IV (pp. 63-67). (Materials Science Forum; Vol. 857). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.857.63

XPS analysis of oxide films on lead-free solders with trace additions of Germanium and gallium. / Watling, K. M.; Chandler-Temple, A.; Nogita, K.
Advanced Materials Engineering and Technology IV. ed. / Mohd Mustafa Al Bakri Abdullah; Rafiza Abd Razak; Muhammad Faheem Mohd Tahir; Mohd Mustafa Al Bakri Abdullah; Rafiza Abd Razak; Liyana Jamaludin. Trans Tech Publications Ltd, 2016. p. 63-67 (Materials Science Forum; Vol. 857).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Watling, KM, Chandler-Temple, A & Nogita, K 2016, XPS analysis of oxide films on lead-free solders with trace additions of Germanium and gallium. in MM Al Bakri Abdullah, RA Razak, MFM Tahir, MM Al Bakri Abdullah, RA Razak & L Jamaludin (eds), Advanced Materials Engineering and Technology IV. Materials Science Forum, vol. 857, Trans Tech Publications Ltd, pp. 63-67, International Conference on Advanced Materials Engineering and Technology, ICAMET 2015, Kaohsiung, Taiwan, Province of China, 12/4/15. https://doi.org/10.4028/www.scientific.net/MSF.857.63

Watling KM, Chandler-Temple A, Nogita K. XPS analysis of oxide films on lead-free solders with trace additions of Germanium and gallium. In Al Bakri Abdullah MM, Razak RA, Tahir MFM, Al Bakri Abdullah MM, Razak RA, Jamaludin L, editors, Advanced Materials Engineering and Technology IV. Trans Tech Publications Ltd. 2016. p. 63-67. (Materials Science Forum). doi: 10.4028/www.scientific.net/MSF.857.63

Watling, K. M. ; Chandler-Temple, A. ; Nogita, K. / XPS analysis of oxide films on lead-free solders with trace additions of Germanium and gallium. Advanced Materials Engineering and Technology IV. editor / Mohd Mustafa Al Bakri Abdullah ; Rafiza Abd Razak ; Muhammad Faheem Mohd Tahir ; Mohd Mustafa Al Bakri Abdullah ; Rafiza Abd Razak ; Liyana Jamaludin. Trans Tech Publications Ltd, 2016. pp. 63-67 (Materials Science Forum).

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XPS analysis of oxide films on lead-free solders with trace additions of Germanium and gallium

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