Valence transition in polycrystalline Eu(Rh1–xCox)2Si2 studied by hard x-ray photoemission spectroscopy

Katsuya Ichiki, Takayuki Matsumoto, Hiroaki Anzai, Ryohei Takeshita, Kodai Abe, Suzuna Ishihara, Takayuki Uozumi, Hitoshi Sato, Awabaikeli Rousuli, Shigenori Ueda, Yukihiro Taguchi, Kenya Shimada, Hirofumi Namatame, Masaki Taniguchi, Suguru Hamano, Akihiro Mitsuda, Hirofumi Wada, Kojiro Mimura

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1 Citation (Scopus)


We have investigated bulk-derived electronic structure of the valence transition system Eu(Rh1–xCox)2Si2 with x = 0 and 0.4 by means of hard x-ray photoemission spectroscopy. The Eu mean valence evaluated from the Eu 3d spectrum for x = 0.4 gradually changes from 2.57 at 300 K to 2.92 at 20 K. On the other hand, the valence for x = 0 retains ∼2.1 in the temperature range from 300 to 20 K. Furthermore, the Eu2+ 4f component in the valence band for x = 0.4 was shifted by 150 meV towards the Fermi level compared to that for x = 0. Present results suggest that the increase in the hybridization strength between Eu 4f and conduction electrons induces the valence transition, which is consistent with the Kondo volume collapse model.

Original languageEnglish
Pages (from-to)28-32
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Publication statusPublished - Oct 2017

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry


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