Transmission electron microscope observations of interfaces in YBa2Cu3Ox/BaSnO3/YBa 2Cu3Ox trilayers

Shintaro Miyazawa, Masashi Mukaida

Research output: Contribution to journalArticlepeer-review


A new insulating material, BaSnO3 with a relatively large mismatch to YBa2Cu3Ox is investigated as a barrier material in a superconductor/ insulator/ superconductor (SIS) structure. All c-axis oriented YBa2Cu3Ox/ BaSnO3/ YBa2Cu3Ox SIS structures are grown by an in situ sequential pulsed laser deposition technique. Transmission electron microscopy (TEM) reveals that BaSnO3 thin films cover well c-axis oriented YBa2Cu3Ox thin films. Moreover, c-axis oriented YBa2Cu3Ox thin films grow epitaxially on BaSnO3 thin films with very good wetability. The relatively large mismatch provides periodical lattice discontinuity, which is probably associated with the generation of dislocations in one third of c-axis unit of YBa2Cu3Ox thin films. This study provides guidelines for selecting insulating materials.

Original languageEnglish
Pages (from-to)L949-L952
JournalJapanese Journal of Applied Physics, Part 2: Letters
Issue number8 PART A
Publication statusPublished - Aug 1 1998
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Engineering
  • Physics and Astronomy (miscellaneous)
  • General Physics and Astronomy


Dive into the research topics of 'Transmission electron microscope observations of interfaces in YBa2Cu3Ox/BaSnO3/YBa 2Cu3Ox trilayers'. Together they form a unique fingerprint.

Cite this