TY - GEN
T1 - Transition-time-relation based capture-safety checking for at-speed scan test generation
AU - Miyase, K.
AU - Wen, X.
AU - Aso, M.
AU - Furukawa, H.
AU - Yamato, Y.
AU - Kajihara, S.
PY - 2011
Y1 - 2011
N2 - Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. This paper presents a novel metric, called the TTR (Transition-Time-Relation-based) metric, which takes transition time relations into consideration in capture-safety checking. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
AB - Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. This paper presents a novel metric, called the TTR (Transition-Time-Relation-based) metric, which takes transition time relations into consideration in capture-safety checking. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.
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M3 - Conference contribution
AN - SCOPUS:79957551358
SN - 9783981080179
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 895
EP - 898
BT - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
T2 - 14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
Y2 - 14 March 2011 through 18 March 2011
ER -