TY - JOUR
T1 - Toward the understanding of annealing effects on (GaIn)2O3 films
AU - Zhang, Fabi
AU - Jan, Hideki
AU - Saito, Katsuhiko
AU - Tanaka, Tooru
AU - Nishio, Mitsuhiro
AU - Nagaoka, Takashi
AU - Arita, Makoto
AU - Guo, Qixin
N1 - Funding Information:
This work was partially supported by the Partnership Project for Fundamental Technology Researches of Ministry of Education, Culture, Sports, Science, and Technology , Japan. We are grateful to Doctor Y. Cui for help on data fitting and discussion.
Publisher Copyright:
© 2015 Elsevier B.V. All rights reserved.
PY - 2015/3/2
Y1 - 2015/3/2
N2 - (GaIn)2O3 films with nominal indium content of 0.3 deposited at room temperature by pulsed laser deposition have been annealed in different gas ambient (N2, vacuum, Ar, O2) and temperatures (700-1000 °C) in order to understand the annealing effects. X-ray diffraction and X-ray rocking curve revealed that the film annealed at 800 °C under O2 ambient has best crystallinity. X-ray photoelectron spectroscopy analysis indicated that oxygen ambient annealing has greatly helped on decreasing the oxygen vacancy. (GaIn)2O3 films with different nominal indium content varying from 0.2 to 0.7 annealed at 800 °C under O2 ambient also showed high crystal quality, improved optical transmittance, and smooth surface.
AB - (GaIn)2O3 films with nominal indium content of 0.3 deposited at room temperature by pulsed laser deposition have been annealed in different gas ambient (N2, vacuum, Ar, O2) and temperatures (700-1000 °C) in order to understand the annealing effects. X-ray diffraction and X-ray rocking curve revealed that the film annealed at 800 °C under O2 ambient has best crystallinity. X-ray photoelectron spectroscopy analysis indicated that oxygen ambient annealing has greatly helped on decreasing the oxygen vacancy. (GaIn)2O3 films with different nominal indium content varying from 0.2 to 0.7 annealed at 800 °C under O2 ambient also showed high crystal quality, improved optical transmittance, and smooth surface.
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U2 - 10.1016/j.tsf.2015.02.003
DO - 10.1016/j.tsf.2015.02.003
M3 - Article
AN - SCOPUS:84925306386
SN - 0040-6090
VL - 578
SP - 1
EP - 6
JO - Thin Solid Films
JF - Thin Solid Films
ER -