Longitudinal electron transport in a-Si:H/a-SiNx:H multilayers has been measured by time-of-flight method. The mechanism involved is explained in terms of tunnel hopping of electrons confined in well layers to neighbors through the barrier layers and multiple trapping process in the well layers. Based on this model, the energy distribution of deep lying tail states in the well layers is estimated.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry