Time-course pattern of electrolyte leakage from tuberous roots of sweetpotato (Ipomoea batatas (L.) Lam.) after short-term high temperature

We investigated the time-course pattern of electrolyte leakage from the root flesh of growing tuberous roots of two sweetpotato cultivars, Koganesengan and Narutokintoki, after exposing them to high temperature for short duration. For both cultivars, the electrolyte leakage after 1 h of treatment was significantly higher than that at 24 h after treatment. This pattern was similar to the pattern observed following instantaneous flooding treatment previously reported by us. Electrolyte leakage from plant cells is an indicator of cellular responses to various stress factors. Similar stress, therefore, might be caused in heated and flooded tuberous roots.