Three-dimensional strain mapping using in situ X-ray synchrotron microtomography

H. Toda, E. Maire, Y. Aoki, M. Kobayashi

Research output: Contribution to journalReview articlepeer-review

37 Citations (Scopus)


Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.

Original languageEnglish
Pages (from-to)549-561
Number of pages13
JournalJournal of Strain Analysis for Engineering Design
Issue number7
Publication statusPublished - Oct 2011
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Modelling and Simulation
  • Mechanics of Materials
  • Mechanical Engineering
  • Applied Mathematics


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