The X-ray microscopy project at Saga SLS

M. Yasumoto, E. Ishiguro, K. Takemoto, T. Tomimasu, H. Kihara, N. Kamijo, T. Tsurushima, A. Takahara, K. Hara, Y. Chikaura

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)


A new high resolution X-ray microscopy project has been proposed at Saga synchrotron light source, which is a third generation synchrotron light facility in Japan. Two microscopy beamlines are planned for this project. One is a scanning microscope in the water window region, and the other is a full-field imaging microscope in the multi-keV X-ray energy region. To demonstrate the feasibility of the project, the optical layout of the scanning microscope was designed. The beamline mainly consists of a 3.5 cm periodical undulator, a varied line-spacing plane grating monochorometer (600 lines/mm) and an end-station including a zone plate. Thus, the calculated X-ray properties focused on the sample position are as follows: the spot size is ∼70 nm, the monochromaticity is ∼2000, and the photon flux is 109 ∼ 1010 photons/sec.

Original languageEnglish
Pages (from-to)63-66
Number of pages4
JournalJournal De Physique. IV : JP
Publication statusPublished - Mar 2003
Event7th International Conference on X-Ray Microscopy - Grenoble, France
Duration: Jul 28 2002Aug 2 2002

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)


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