TY - JOUR
T1 - The crystallinity and surface morphology of zinc octaethylporphyrin thin films on an indium-tin-oxide substrate
AU - Ryuzaki, S.
AU - Onoe, J.
N1 - Funding Information:
One of the authors (S.R.) is thankful to Dr. T. Kiguchi (Tokyo Institute of Technology) and Mr. H. Matsuo (Tokyo Institute of Technology) for their help of XRD measurements, and Professor Yano (Tokyo Institute of Technology) and Mr. Tobitsuka (Tokyo Institute of Technology) for their help of SEM measurements. This work was financially supported by funding of J-Power Co., Ltd.
PY - 2008
Y1 - 2008
N2 - The crystallinity and surface morphology of zinc octaethylporphyrin, Zn(OEP), thin films (20 nm thick) deposited on an indium-tin-oxide substrate have been investigated using x-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD and SEM results show that the Zn(OEP) film formed at room temperature (RT) was amorphous and its surface morphology was smooth, whereas the film deposited at 473 K was crystalline and its surface morphology became rough compared to that formed at RT. On the other hand, when the Zn(OEP) film formed at RT was subsequently annealed at 473 K for 1 min, the film was crystallized as well as formed at 473 K but its surface morphology was maintained to be smooth.
AB - The crystallinity and surface morphology of zinc octaethylporphyrin, Zn(OEP), thin films (20 nm thick) deposited on an indium-tin-oxide substrate have been investigated using x-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD and SEM results show that the Zn(OEP) film formed at room temperature (RT) was amorphous and its surface morphology was smooth, whereas the film deposited at 473 K was crystalline and its surface morphology became rough compared to that formed at RT. On the other hand, when the Zn(OEP) film formed at RT was subsequently annealed at 473 K for 1 min, the film was crystallized as well as formed at 473 K but its surface morphology was maintained to be smooth.
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U2 - 10.1063/1.2838204
DO - 10.1063/1.2838204
M3 - Article
AN - SCOPUS:39349107019
SN - 0021-8979
VL - 103
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 3
M1 - 033516
ER -