Temperature mapping on a suspended carbon nanotube using electron thermal microscopy

Koji Takahashi; Kazuma Nomoto; Tatsuya Ikuta

doi:10.1109/NANO.2015.7388726

Temperature mapping on a suspended carbon nanotube using electron thermal microscopy

Koji Takahashi, Kazuma Nomoto, Tatsuya Ikuta

Thermophysics and Fluid Mechanics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Nanoscale thermal mapping along an individual multi-walled carbon nanotube suspended between two electrodes/heat-sinks was successfully demonstrated by using the solid/liquid phase transition of indium nanoparticles in a transmission electron microscope. The brightness shift of nanoparticles in the dark-field image was clearly recognized according to the DC heating of the nanotube. It was also found that the indium deposition induces defects in the nanotube, resulting in the decrease of thermal conductivity. The temperature distribution along the nanotube obtained from the dark-field images showed good agreement with the simulated data of a defective nanotube with Joule-heating.

Original language	English
Title of host publication	IEEE-NANO 2015 - 15th International Conference on Nanotechnology
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	781-784
Number of pages	4
ISBN (Electronic)	9781467381550
DOIs	https://doi.org/10.1109/NANO.2015.7388726
Publication status	Published - 2015
Event	15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy Duration: Jul 27 2015 → Jul 30 2015

Publication series

Name	IEEE-NANO 2015 - 15th International Conference on Nanotechnology

Other

Other	15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
Country/Territory	Italy
City	Rome
Period	7/27/15 → 7/30/15

All Science Journal Classification (ASJC) codes

Process Chemistry and Technology
Electrical and Electronic Engineering
Ceramics and Composites
Electronic, Optical and Magnetic Materials
Surfaces, Coatings and Films

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10.1109/NANO.2015.7388726

Cite this

Takahashi, K., Nomoto, K., & Ikuta, T. (2015). Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. In IEEE-NANO 2015 - 15th International Conference on Nanotechnology (pp. 781-784). Article 7388726 (IEEE-NANO 2015 - 15th International Conference on Nanotechnology). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NANO.2015.7388726

Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. / Takahashi, Koji; Nomoto, Kazuma; Ikuta, Tatsuya.
IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. p. 781-784 7388726 (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Takahashi, K, Nomoto, K & Ikuta, T 2015, Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. in IEEE-NANO 2015 - 15th International Conference on Nanotechnology., 7388726, IEEE-NANO 2015 - 15th International Conference on Nanotechnology, Institute of Electrical and Electronics Engineers Inc., pp. 781-784, 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015, Rome, Italy, 7/27/15. https://doi.org/10.1109/NANO.2015.7388726

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abstract = "Nanoscale thermal mapping along an individual multi-walled carbon nanotube suspended between two electrodes/heat-sinks was successfully demonstrated by using the solid/liquid phase transition of indium nanoparticles in a transmission electron microscope. The brightness shift of nanoparticles in the dark-field image was clearly recognized according to the DC heating of the nanotube. It was also found that the indium deposition induces defects in the nanotube, resulting in the decrease of thermal conductivity. The temperature distribution along the nanotube obtained from the dark-field images showed good agreement with the simulated data of a defective nanotube with Joule-heating.",

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AB - Nanoscale thermal mapping along an individual multi-walled carbon nanotube suspended between two electrodes/heat-sinks was successfully demonstrated by using the solid/liquid phase transition of indium nanoparticles in a transmission electron microscope. The brightness shift of nanoparticles in the dark-field image was clearly recognized according to the DC heating of the nanotube. It was also found that the indium deposition induces defects in the nanotube, resulting in the decrease of thermal conductivity. The temperature distribution along the nanotube obtained from the dark-field images showed good agreement with the simulated data of a defective nanotube with Joule-heating.

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Temperature mapping on a suspended carbon nanotube using electron thermal microscopy

Abstract

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