Translated title of the contribution: Development of An <i>In-Situ</i> Straining and Tomography System in TEM

波多 聰, 宮崎 裕也, 斉藤 光, 村山 光宏, 佐藤 和久, 工藤 博幸, 古河 弘光, 川本 克巳, 堀井 則孝, 加茂 勝己, 宮崎 伸介, 權堂 貴志

Research output: Contribution to journalArticlepeer-review


<p>We have developed a unique methodology and a new hardware/software-integrated system for in-situ straining and electron tomography (ET) experiments. The central software of the system controls a straining-and-tomography specimen holder, imaging devices and the specimen stage of a transmission electron microscope (TEM) in an integrated manner. Using the system, one can perform in-situ time-resolved three-dimensional (3D) studies that explore in real-time and at sub-microscopic levels the internal behavior of materials subjected to external stresses. 3D visualization of a Pb–Sn solder alloy thin foil's deformation dynamics by iterative step-wise stress loading and tilt-series data sets acquisition is introduced as an application of the system.</p>
Translated title of the contributionDevelopment of An <i>In-Situ</i> Straining and Tomography System in TEM
Original languageJapanese
Pages (from-to)44-48
Number of pages5
Issue number1
Publication statusPublished - 2019


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