TY - JOUR
T1 - Synthesis and electrical properties of phosphorus-doped homoepitaxial diamond (111) by microwave plasma-assisted chemical vapor deposition using triethylphosphine as a dopant source
AU - Saito, Takeyasu
AU - Kameta, Masanori
AU - Kusakabe, Katsuki
AU - Morooka, Shigeharu
AU - Maeda, Hideaki
AU - Hayashi, Yasunori
AU - Asano, Tanemasa
PY - 1998/5/1
Y1 - 1998/5/1
N2 - A phosphorus-doped (111) diamond film was formed homoepitaxially on a nondoped diamond film, which was also formed homoepitaxially on a type Ib (111) diamond substrate, by microwave plasma-assisted chemical vapor deposition using CH4 as the carbon source and triethylphosphine (TEP, P(C2H5)3) as the dopant source. The P-doped film, which was approximately 800 nm in thickness, exhibited an n-type conduction in the temperature range of 100-500 K. This represents the first such observation, for a film prepared using TEP as the dopant. The activation energy for carrier concentration was 0.09 eV in the range of 145-500 K. The Hall mobility reached a maximum of approximately 3.5 cm2/(V·s) at 145 K and decreased to 0.15 cm2/(V·s) at 500 K. Phosphorus was uniformly incorporated into the diamond film, as evidenced by secondary ion mass spectrometry.
AB - A phosphorus-doped (111) diamond film was formed homoepitaxially on a nondoped diamond film, which was also formed homoepitaxially on a type Ib (111) diamond substrate, by microwave plasma-assisted chemical vapor deposition using CH4 as the carbon source and triethylphosphine (TEP, P(C2H5)3) as the dopant source. The P-doped film, which was approximately 800 nm in thickness, exhibited an n-type conduction in the temperature range of 100-500 K. This represents the first such observation, for a film prepared using TEP as the dopant. The activation energy for carrier concentration was 0.09 eV in the range of 145-500 K. The Hall mobility reached a maximum of approximately 3.5 cm2/(V·s) at 145 K and decreased to 0.15 cm2/(V·s) at 500 K. Phosphorus was uniformly incorporated into the diamond film, as evidenced by secondary ion mass spectrometry.
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U2 - 10.1143/jjap.37.l543
DO - 10.1143/jjap.37.l543
M3 - Article
AN - SCOPUS:0032072593
SN - 0021-4922
VL - 37
SP - L543-L546
JO - Japanese Journal of Applied Physics, Part 2: Letters
JF - Japanese Journal of Applied Physics, Part 2: Letters
IS - 5 PART A
ER -