Surface mobile layer of polystyrene film below bulk glass transition temperature [5]

Daisuke Kawaguchi; Keiji Tanaka; Atsushi Takahara; Tisato Kajiyama

doi:10.1021/ma010012k

Surface mobile layer of polystyrene film below bulk glass transition temperature [5]

Daisuke Kawaguchi, Keiji Tanaka, Atsushi Takahara, Tisato Kajiyama

Department of Applied Molecular Chemistry

Research output: Contribution to journal › Letter › peer-review

58 Citations (Scopus)

Abstract

Interfacial thickness of surface mobile layer of polystyrene (PS) film below bulk glass transition temperature was studied. Uniformity of the bilayer interface, built from two surfaces of monodisperse PS (hPS) and monodisperse deuterated PS (dPS), was confirmed using atomic force microscopy. The interfacial broadening of the bilayer by annealing was examined on the basis of depth profiling by dynamic secondary ion mass spectroscopic (DSIMS) measurements. Interfacial thickness was found to monotically increase with annealing time at 393 K above bulk glass transition temperature. Results indicated constant interfacial thickness at temperatures between bulk glass transition temperature and surface glass transition temperature.

Original language	English
Pages (from-to)	6164-6166
Number of pages	3
Journal	Macromolecules
Volume	34
Issue number	18
DOIs	https://doi.org/10.1021/ma010012k
Publication status	Published - Aug 28 2001

All Science Journal Classification (ASJC) codes

Organic Chemistry
Polymers and Plastics
Inorganic Chemistry
Materials Chemistry

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10.1021/ma010012k

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@article{9745266f81ff41a3a875c121a0f5fe20,

title = "Surface mobile layer of polystyrene film below bulk glass transition temperature [5]",

abstract = "Interfacial thickness of surface mobile layer of polystyrene (PS) film below bulk glass transition temperature was studied. Uniformity of the bilayer interface, built from two surfaces of monodisperse PS (hPS) and monodisperse deuterated PS (dPS), was confirmed using atomic force microscopy. The interfacial broadening of the bilayer by annealing was examined on the basis of depth profiling by dynamic secondary ion mass spectroscopic (DSIMS) measurements. Interfacial thickness was found to monotically increase with annealing time at 393 K above bulk glass transition temperature. Results indicated constant interfacial thickness at temperatures between bulk glass transition temperature and surface glass transition temperature.",

author = "Daisuke Kawaguchi and Keiji Tanaka and Atsushi Takahara and Tisato Kajiyama",

year = "2001",

month = aug,

day = "28",

doi = "10.1021/ma010012k",

language = "English",

volume = "34",

pages = "6164--6166",

journal = "Macromolecules",

issn = "0024-9297",

publisher = "American Chemical Society",

number = "18",

}

TY - JOUR

T1 - Surface mobile layer of polystyrene film below bulk glass transition temperature [5]

AU - Kawaguchi, Daisuke

AU - Tanaka, Keiji

AU - Takahara, Atsushi

AU - Kajiyama, Tisato

PY - 2001/8/28

Y1 - 2001/8/28

N2 - Interfacial thickness of surface mobile layer of polystyrene (PS) film below bulk glass transition temperature was studied. Uniformity of the bilayer interface, built from two surfaces of monodisperse PS (hPS) and monodisperse deuterated PS (dPS), was confirmed using atomic force microscopy. The interfacial broadening of the bilayer by annealing was examined on the basis of depth profiling by dynamic secondary ion mass spectroscopic (DSIMS) measurements. Interfacial thickness was found to monotically increase with annealing time at 393 K above bulk glass transition temperature. Results indicated constant interfacial thickness at temperatures between bulk glass transition temperature and surface glass transition temperature.

AB - Interfacial thickness of surface mobile layer of polystyrene (PS) film below bulk glass transition temperature was studied. Uniformity of the bilayer interface, built from two surfaces of monodisperse PS (hPS) and monodisperse deuterated PS (dPS), was confirmed using atomic force microscopy. The interfacial broadening of the bilayer by annealing was examined on the basis of depth profiling by dynamic secondary ion mass spectroscopic (DSIMS) measurements. Interfacial thickness was found to monotically increase with annealing time at 393 K above bulk glass transition temperature. Results indicated constant interfacial thickness at temperatures between bulk glass transition temperature and surface glass transition temperature.

UR - http://www.scopus.com/inward/record.url?scp=0035964512&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035964512&partnerID=8YFLogxK

U2 - 10.1021/ma010012k

DO - 10.1021/ma010012k

M3 - Letter

AN - SCOPUS:0035964512

SN - 0024-9297

VL - 34

SP - 6164

EP - 6166

JO - Macromolecules

JF - Macromolecules

IS - 18

ER -

Surface mobile layer of polystyrene film below bulk glass transition temperature [5]

Abstract

All Science Journal Classification (ASJC) codes

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